Tag Archives: measurement accuracy

Does it matter? part 3: Natural background radiation

[With thanks to dr. Masato Ohnuma for bringing this to my attention] It is all around us, and occasionally all through us, and every now and then, your small-angle scattering detector might see them: photons from┬ánature. Do we need to consider these all-natural organic photons in the data corrections we do, or can we safely […]

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Ruler vs. Silver behenate: Trust but verify

One of the most important parameters you need when analyzing small-angle scattering patterns is the distance from the sample to the detector, as this defines the scattering wave vector q. This is often determined using the same approach as for wide-angle diffraction: measurement of a standard crystalline sample. Whereas in the past, stretched rat tail […]

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Nothing new here

So it seems science has beaten us to the punch once again. Remember last week’s optimistic story on how you can make better use of your (measurement) time? Turns out it has been done (at least once) before. The year was 1993, the authors were M. Steinhart and J. Ple┼ítil, and they did the same […]

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Making better use of your time: optimizing measurement time

Often, especially when measuring on big facilities, you are given a limited amount of time. So when it comes to measuring the sample and the background, this limited time has to be divided between a measurement of the sample, and a measurement of the background. Normally, one would spend about 50% of the time on […]

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Data processing flowchart and news on an old publication

Short news first; by going through the motions and waiting for Elsevier to get back to me, I have gotten permission (for the royal sum of 0.00 eurodollars) to repost one more paper from Polymer on my site. So that has now gone in the 2010 publications page here. Then it is time to give […]

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